Phenom Pure G7 Desktop Scanning Electron Microscope
Phenom Pure G7 is an economical desktop Scanning Electron Microscope (SEM) that provides high resolution imaging that is superfast and easy to use.
Phenom Pure G7 Desktop Scanning Electron Microscope
Phenom Pure G7 is an economical desktop Scanning Electron Microscope (SEM) that provides high resolution imaging that is superfast and easy to use.
| Manufacturer | Thermo Scientific |
|---|---|
| Product Series | Phenom Desktop SEM |
| Measurement principle | Electron Microscopy SEM & Elemental Mapping |
| Application | Scanning Electron Microscopy |
| Sample type | Materials, metals, pharmaceuticals, chemical, polymers, forensics |
| SEM magnification | 160 - 175,000x |
| Resolution | <15nm | 15nm
| Optical magnification | 27x |
| Sample size | Up to 32mm |
| Load to image time | <30sec | 30sec
Product Overview
Phenom Pure G7 desktop Scanning Electron Microscope (SEM) is based on the widely recognised Phenom desktop SEM platform and is a high-performance SEM for imaging and analysis.
It is an affordable desktop Scanning Electron Microscope (SEM) designed for extreme ease of use and fast sample imaging. The proprietary venting/loading mechanism enables the highest throughput and ensures a time-to- image of less than 30 seconds. The unique optical navigation camera displays a view of the entire sample and allows the user to move to any spot on the sample with just a single click.
The high brightness cerium hexaboride (CeB6) electron source reduces maintenance costs, lasting 30 times longer than traditional tungsten filaments. In combination with the four-segment Backscatter detector (BSD) it yields sharp images together with chemical contrast information.
When user requirements change over time, the Phenom Pure G7 SEM can be upgraded to the Phenom Pro or ProX Desktop SEM models for enhanced capabilities.
Originating from parent companies FEI and Philips, all Phenom desktop SEM systems are built to high-quality standards and offer a new approach for high-resolution imaging which is extremely fast and easy to use. The user interface supports both existing and new users to quickly become familiar with the system and get the most out of it without the need for significant set-up or training.
The Phenom SEM covers a wide range of applications which include Forensic investigation, Material characterisation, Metallurgy analysis, Process control, Pharmaceutical and Industrial research and more.
- Demonstration Video
- Benefits
- Applications
- Accessories
Demonstration Video
Benefits
Super fast, affordable SEM
After loading the sample an instant optical image is received followed by an electron image in <30 seconds.
Ease of use with “never lost” sample navigation
Equipped with an optical colour microscope the user can swiftly navigate to any region of interest with just a single click and keep the image overview of the sample.
Low maintenance
The long lifetime, high brightness thermionic source (CeB6 ) enables extremely stable operation and has a typical operational lifetime of 3000 hours, which is ideal for maximum useability, serviceability and uptime.
Multiple detectors for additional information
Back-Scatter Detector (BSD) yields sharp images and provides chemical contrast information. An optional Secondary Electron Detector (SED) enables surface sensitive imaging.
Acceleration voltages can be adjusted: 5 kV to 15 kV.
Intuitive software
- ChemiSEM Technology – provides real-time, color-coded elemental mapping.
- PPI/PPA – Programming Interface (API) that enables users to control Phenom desktop SEM through Python scripting.
- ProSuite – includes applications such as ParticleMetric, PoroMetric, FiberMetric and 3D Roughness Reconstruction.
- Maps 3 Software – automates acquisition of large datasets, including SEM imaging and EDS mapping, and seamlessly stiches and aligns them to provide detailed images across large sample areas.
Applications
- Material sciences – observe and analyse surfaces, compounds and particles Industrial manufacturing – paints & coatings, construction materials, filtration, automotive and aerospace engineering
- Industrial manufacturing – paints & coatings, construction materials, filtration,automotive and aerospace engineering
- Life sciences – Biomedical, food, microbiology, cell biology
- Forensics – Crime scene investigation, gunshot residue, traffic accidents
- Electronics – component PCBs, MEMS, Semiconductor and data storage
- Earth Sciences –Environment, minerals, Paleontology
- Education – inspire young students to see the world 10 times smaller than the wavelength of visible light
Accessories
Standard sample holder
Suitable for most samples up to 25mm diameter and 30mm height, mounted on standard sample pin stubs.

Charge reduction sample holder
Designed to reduce charging and eliminate extra sample preparation (coating) for non-conductive samples such as paper, organic material, glass… etc

Metallurgical sample holder
Designed to support resin-mounted samples for metallurgy or when working with inserts. Charge reduction version also available for non-conductive samples.

Micro tool and tilt-rotation sample holder
Suitable for imaging long objects such as drill bits, milling tools and needles.

Motorized tilt and rotation sample holder
Enables a unique 3D image of your sample by allowing the analysis from all visible sides.

Temperature controlled sample holder
Allows the study of vacuum sensitive and fragile samples such as biological, food or organic coatings. Temperature can be controlled from -25°C to +50°C.

X-view Insert
Provides fast, easy clamping without the need for screws and is ideal for cross sectional imaging of coatings and multilayer samples.

Micro-electronics insert
Provides a unique clamping mechanism for imaging semi conductor, microelectronics or solar cells.

Nebula
Provides uniform dry powder dispersion on SEM pin stubs while protecting fragile particle structures.

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Product Enquiry
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