BENEFITS

All in one imaging and analysis

Compact desktop SEM with X-ray (EDS) analysis that needs little space and no extra facilities that allows sample structures can be physically examined and their elemental composition determined.

Super-fast, sharp, high-contrast images

After loading the sample an instant optical image is received followed by an electron image in < 25 seconds. Advanced detectors can acquire high quality images with magnifications of up to 2 million times and resolutions below two nanometers.

Ease of use with “never lost” sample navigation

Equipped with an optical colour microscope the user can swiftly navigate to any region of interest with just a single click and keep the image overview of the sample.

Low maintenance FEG Source

The long lifetime, high brightness FEG source enables extremely stable operation and has a typical operational lifetime of >10,000 hours, which is ideal for maximum useability, serviceability and uptime.

Multiple detectors for additional information
Back-Scatter Detector (BSD) yields sharp images and provides chemical contrast information. An optional Secondary Electron Detector (SED) enables surface sensitive imaging.

Intuitive software

The distribution of elements can be studied using Point analysis, Elemental Mapping and Line Scan. Software includes applications such as ParticleMetric, PoroMetric, FiberMetric and 3D Roughness Reconstruction.

APPLICATIONS

• Material sciences – observe and analyse surfaces, compounds and particles
• Industrial manufacturing – paints & coatings, construction materials, filtration, automotive and aerospace engineering
• Life sciences – Biomedical, food, microbiology, cell biology
• Forensics – Crime scene investigation, gunshot residue, traffic accidents
• Electronics – component PCBs, MEMS, Semiconductor and data storage
• Earth Sciences –Environment, minerals, Paleontology
• Education – inspire young students to see the world 10 times smaller than the wavelength of visible light

ACCESSORIES

Standard sample holder

Suitable for most samples up to 25mm diameter and 30mm height, mounted on standard sample pin stubs.

Charge reduction sample holder

Designed to reduce charging and eliminate extra sample preparation (coating) for non-conductive samples such as paper, organic material, glass… etc

Metallurgical sample holder

Designed to support resin-mounted samples for metallurgy or when working with inserts. Charge reduction version also available for non-conductive samples.

Micro tool and tilt-rotation sample holder

Suitable for imaging long objects such as drill bits, milling tools and needles.

Motorized tilt and rotation sample holder

Enables a unique 3D image of your sample by allowing the analysis from all visible sides.

Temperature controlled sample holder

Allows the study of vacuum sensitive and fragile samples such as biological, food or organic coatings. Temperature can be controlled from -25°C to +50°C.

X-view Insert

Provides fast, easy clamping without the need for screws and is ideal for cross sectional imaging of coatings and multilayer samples.

Micro-electronics insert

Provides a unique clamping mechanism for imaging semi conductor, microelectronics or solar cells.

Nebula

Provides uniform dry powder dispersion on SEM pin stubs while protecting fragile particle structures.