Phenom Pharos G2 Desktop FEG SEM

Phenom Pharos desktop scanning electron microscope is the very first desktop SEM that comes with a FEG source to deliver crisp, high-quality images with magnifications of up to 2 million times.

Phenom Pharos G2 Desktop FEG SEM

Phenom Pharos desktop scanning electron microscope is the very first desktop SEM that comes with a FEG source to deliver crisp, high-quality images with magnifications of up to 2 million times.

Manufacturer Thermo Scientific
Product Series Phenom Desktop SEM
Measurement principle Electron Microscopy SEM & Elemental Mapping
Application Elemental Mapping (EDS), Scanning Electron Microscopy
Sample type Materials, metals, pharmaceuticals, chemical, polymers, forensics
SEM magnification2,000,000x
Sample size (diameter)up to 32mm
Load to image time<25sec
Acceleration VoltagesAdjustable range between 1 kV and 20 kV

Product Overview

Phenom Pharos G2 desktop Field Emission Gun – Scanning Electron Microscope (FEG-SEM) offers floor model performance on a desktop microscope with loads of added benefits that make it fast and easy to operate. Users can quickly load samples and within a few seconds characterise their size, shape and chemical composition.

The Phenom Pharos G2 is intuitive to operate and highly productive, making it a versatile instrument for high-volume industrial and academic labs to achieve advances in manufacturing, electronics, clean energy and many other applications.  Images can be obtained in <25 seconds for high sample throughput. An intuitive user interface on a widescreen, 24-inch monitor with presets simplifies use while an integrated power supply and robust parts ensure the reproducibility of data.

Fully integrated advanced detectors acquire high quality images up to 2 million times in magnification, at 2.0 nanometer (nm) resolution and up to 20 kilovolts (kV). Users can also image soft, beam-sensitive or insulating samples at energy levels as low as 1 kV, obtaining high-resolution views into polymers and multilayer organic films without damaging or obscuring their nanoscale features.

The Phenom Pharos G2 delivers high resolutions and a wide acceleration voltage range, all in a desktop system that can fit within a lab or office. Contact us for more information or for a demonstration.

Notes: Phenom-World is now part of Thermo Fisher Scientific.  The Phenom Pharos is a user friendly and affordable tool that offers the benefits of a FEG source on a desktop microscope. Originating from parent companies FEI and Philips, all Phenom desktop SEM systems are built to high quality standards and offer a new approach for faster high resolution imaging with extreme ease of use. The user interface supports both existing and new users to quickly become familiar with the system and get the most of it without the need for significant set-up or training.




All in one imaging and analysis

Compact desktop SEM with X-ray (EDS) analysis that needs little space and no extra facilities that allows sample structures can be physically examined and their elemental composition determined.

Super-fast, sharp, high-contrast images

After loading the sample an instant optical image is received followed by an electron image in < 25 seconds. Advanced detectors can acquire high quality images with magnifications of up to 2 million times and resolutions below two nanometers.

Ease of use with “never lost” sample navigation

Equipped with an optical colour microscope the user can swiftly navigate to any region of interest with just a single click and keep the image overview of the sample.

Low maintenance FEG Source

The long lifetime, high brightness FEG source enables extremely stable operation and has a typical operational lifetime of >10,000 hours, which is ideal for maximum useability, serviceability and uptime.

Multiple detectors for additional information
Back-Scatter Detector (BSD) yields sharp images and provides chemical contrast information. An optional Secondary Electron Detector (SED) enables surface sensitive imaging.

Intuitive software

The distribution of elements can be studied using Point analysis, Elemental Mapping and Line Scan. Software includes applications such as ParticleMetric, PoroMetric, FiberMetric and 3D Roughness Reconstruction.


  • Material sciences – observe and analyse surfaces, compounds and particles
  • Industrial manufacturing – paints & coatings, construction materials, filtration, automotive and aerospace engineering
  • Life sciences – Biomedical, food, microbiology, cell biology
  • Forensics – Crime scene investigation, gunshot residue, traffic accidents
  • Electronics – component PCBs, MEMS, Semiconductor and data storage
  • Earth Sciences –Environment, minerals, Paleontology
  • Education – inspire young students to see the world 10 times smaller than the wavelength of visible light


Standard sample holder

Suitable for most samples up to 25mm diameter and 30mm height, mounted on standard sample pin stubs.

Charge reduction sample holder

Designed to reduce charging and eliminate extra sample preparation (coating) for non-conductive samples such as paper, organic material, glass… etc

Metallurgical sample holder

Designed to support resin-mounted samples for metallurgy or when working with inserts. Charge reduction version also available for non-conductive samples.

Micro tool and tilt-rotation sample holder

Suitable for imaging long objects such as drill bits, milling tools and needles.

Motorized tilt and rotation sample holder

Enables a unique 3D image of your sample by allowing the analysis from all visible sides.

Temperature controlled sample holder

Allows the study of vacuum sensitive and fragile samples such as biological, food or organic coatings. Temperature can be controlled from -25°C to +50°C.







X-view Insert

Provides fast, easy clamping without the need for screws and is ideal for cross sectional imaging of coatings and multilayer samples.


Micro-electronics insert

Provides a unique clamping mechanism for imaging semi conductor, microelectronics or solar cells.








Provides uniform dry powder dispersion on SEM pin stubs while protecting fragile particle structures.

Product Enquiry


If you would like to enquire about this product, fill out this form and one of our product specialists will contact you shortly.
If you need help in the operation or repair of an instrument then please contact the Customer Help Centre directly.

Please note, product enquiries are only applicable to Australia, New Zealand, Papua New Guinea and Fiji

    Or call us instead at (02) 9541 3500