27th New Zealand Conference on Microscopy
Feb 02 - 04 2015
ATA Scientific was an exhibitor at the NZ Conference on Microscopy held on 2-4 February 2015 at the University of Otago in Dunedin.
The new Desktop Scanning Electron Microscope (SEM) from Phenom-World was demonstrated at our booth. This system enables rapid imaging (<30sec from loading to sem image) with integrated eds/x-ray analysis for element identification. “never lost” navigation and software applications such as particlemetric, fibremetric, 3d roughness mapping the phenom has been developed enable users extract maximum information images. contact us more information.
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