02 9541 3500Join us and use the latest Phenom ProX desktop SEM
PHENOM SEM WORKSHOP in New Zealand
Date: 21st and 22nd February 2019 (Morning or afternoon sessions available)
Location: University of Auckland, Science Centre, Building 302, 23 Symonds Street, Auckland City, Auckland (Room number advised upon registration). Other locations available upon request.
On show:
Phenom ProX (Gen 5) with X-ray analysis (EDS) for Elemental Identification.
The Phenom desktop Scanning Electron Microscope (SEM) is an affordable, fast and easy to use tool suitable for investigating micron and submicron structures in high resolution. It delivers enhanced imaging performance (up to 150,000x magnification and <8nm resolution, BSD, SED, EDS – particle, pore & fibre metrology), plus fully integrated x-ray analysis (EDS), fastest time to imaging (<30sec) and “never lost” navigation.
Program: This workshop will present the latest Phenom Pro X desktop SEM and accessories. Both new and existing users are invited to enjoy the comprehensive demonstrations followed by additional “hands on” time for sample analysis. Attendees are welcome to bring their own samples for analysis.
Note: This workshop will be repeated at other venues upon request. Please contact us if you are interested in hosting an onsite demo within your facility.