Phenom XL G3 desktop Scanning Electron Microscope (SEM) is designed for extreme ease of use and allows faster imaging of large samples up to 100mm x 100mm at an improved resolution of <9 nanometers.
A key feature of the Phenom XL G3 is its easy-to-use, intuitive user interface (UI). Based on the proven ease-of-use technology already applied in the series, the workflow for the analysis software is now integrated meaning users can view images and perform analysis simultaneously on a single screen. Operating the SEM has been made easier via the interactive databar and overlay structure. The interface enables both existing and new users to quickly become familiar with the system with less training.
The proprietary venting/loading mechanism supports the highest throughput and ensures a time-to-image in just 40 seconds. The unique optical navigation camera displays a view of the entire sample and allows the user to move to any spot on the sample with just a single click. The long-life CeB6 electron source in combination with the four-segment Backscatter detector (BSD) yields sharp images together with chemical contrast information. The Phenom XL can also be equipped with a Secondary Electron Detector (SED) that supports surface sensitive imaging. Unlike other systems the Phenom has fully integrated X-Ray analysis (Energy Dispersive Spectrometer, EDS) that allows the user to quickly identify and assess the distribution of elements in a sample.
Further analysis is provided using optional ChemiSEM Technology, PPI/PPA, Maps 3, and ProSuite software which includes ParticleMetric, PoroMetric, FiberMetric and 3D Roughness Reconstruction.
The Phenom XL covers a wide range of applications such as Forensic investigation, Material characterisation, Metallurgy analysis, Process control, Pharmaceutical and Industrial research and more.
Phenom ParticleX TC/AM/Steel/Battery series is designed to provide technical cleanliness, additive manufacturing, steel manufacturing and battery development companies faster QC analyses of materials.The Phenom ParticleX includes a broad range of automated SEM analyses to identify faults in materials or gauge the impact development and production changes have on a final product. Consisting of a high-performance Phenom XL Desktop SEM with automation software packages, the Phenom ParticleX provides in-house analysis and validation of produced goods against industry-approved standards, up to ten times faster than outsourcing.