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Phenom XL G3

Thermo Fisher Scientific

Phenom XL G3 is the new all-in-one desktop Scanning Electron Microscope (SEM) that is superfast and easy to use and provides high resolution imaging with elemental analysis of large samples up to 100mm x 100mm.
Manufacturer Thermo Scientific
Product Series Phenom Desktop SEM
Measurement principle Electron Microscopy SEM & Elemental Mapping
Application Elemental Mapping (EDS), Scanning Electron Microscopy
Sample type Materials, metals, pharmaceuticals, chemical, polymers, forensics
SEM magnification 160-200,000x
Resolution <9nm
Optical magnification 3-16x
Sample size Up to 100mm (36 x 12mm pin stubs)
Load to image time <40sec

Phenom XL G3 desktop Scanning Electron Microscope (SEM) is designed for extreme ease of use and allows faster imaging of large samples up to 100mm x 100mm at an improved resolution of <9 nanometers.

A key feature of the Phenom XL G3 is its easy-to-use, intuitive user interface (UI). Based on the proven ease-of-use technology already applied in the series, the workflow for the analysis software is now integrated meaning users can view images and perform analysis simultaneously on a single screen. Operating the SEM has been made easier via the interactive databar and overlay structure. The interface enables both existing and new users to quickly become familiar with the system with less training.

The proprietary venting/loading mechanism supports the highest throughput and ensures a time-to-image in just 40 seconds. The unique optical navigation camera displays a view of the entire sample and allows the user to move to any spot on the sample with just a single click. The long-life CeB6 electron source in combination with the four-segment Backscatter detector (BSD) yields sharp images together with chemical contrast information. The Phenom XL can also be equipped with a Secondary Electron Detector (SED) that supports surface sensitive imaging. Unlike other systems the Phenom has fully integrated X-Ray analysis (Energy Dispersive Spectrometer, EDS) that allows the user to quickly identify and assess the distribution of elements in a sample.

Further analysis is provided using optional ChemiSEM Technology, PPI/PPA,  Maps 3, and ProSuite software which includes ParticleMetric, PoroMetric, FiberMetric and 3D Roughness Reconstruction.

The Phenom XL covers a wide range of applications such as Forensic investigation, Material characterisation, Metallurgy analysis, Process control, Pharmaceutical and Industrial research and more.

Phenom ParticleX TC/AM/Steel/Battery series is designed to provide technical cleanliness, additive manufacturing, steel manufacturing and battery development companies faster QC analyses of materials.The Phenom ParticleX includes a broad range of automated SEM analyses to identify faults in materials or gauge the impact development and production changes have on a final product. Consisting of a high-performance Phenom XL Desktop SEM with automation software packages, the Phenom ParticleX provides in-house analysis and validation of produced goods against industry-approved standards, up to ten times faster than outsourcing.

Resources

NEW All in one imaging and analysis
Compact desktop SEM with X-ray (EDS) analysis that needs little space and no extra facilities that allows sample structures can be physically examined and their elemental composition determined.

Super-fast
After loading the sample an instant optical image is received followed by an electron image in < 40 seconds.

Ease of use with “never lost” sample navigation
Equipped with an optical colour microscope the user can swiftly navigate to any region of interest with just a single click and keep the image overview of the sample.

Multiple detectors for additional information
Back-Scatter Detector (BSD) yields sharp images and provides chemical contrast information. An optional Secondary Electron Detector (SED) enables surface sensitive imaging. The fully integrated Energy Dispersive Spectroscopy (EDS) system provides elemental analysis. Acceleration voltages can be adjusted: 2 kV, 5 kV, 10 kV, 15 kV, and 20 kV.

Low maintenance
The long lifetime, high brightness thermionic source (CeB6 ) enables extremely stable operation and has a typical operational lifetime of up to 3000 hours (double the G2), which is ideal for maximum useability, serviceability and uptime.

Intuitive software

The distribution of elements can be studied using Point analysis, Elemental Mapping and Line Scan.

  • ChemiSEM Technology – provides real-time, color-coded elemental mapping.
  • PPI/PPA – Programming Interface (API) that enables users to control Phenom desktop SEM through Python scripting.
  • ProSuite –  includes applications such as ParticleMetric, PoroMetric, FiberMetric and 3D Roughness Reconstruction.
  • Maps 3 Software – automates acquisition of large datasets, including SEM imaging and EDS mapping, and seamlessly stiches and aligns them to provide detailed images across large sample areas.
  • Material sciences – observe and analyse surfaces, compounds and particles
  • Industrial manufacturing – paints & coatings, construction materials, filtration, automotive and aerospace engineering
  • Life sciences – Biomedical, food, microbiology, cell biology
  • Forensics – Crime scene investigation, gunshot residue, traffic accidents
  • Electronics – component PCBs, MEMS, Semiconductor and data storage
  • Earth Sciences –Environment, minerals, Paleontology
  • Education – inspire young students to see the world 10 times smaller than the wavelength of visible light

Standard sample holder

The standard sample holder is a compact stage allowing analysis of samples of up to 100 mm x 100 mm. The holder can be extended with 3 types of resin or metallurgical mount inserts.

Sample size

  • 100 mm x 100 mm (up to 36 x 12 mm pin stubs)
  • Max. 65 mm (h)

Eucentric sample holder

This unique  6 axis Eucentric sample holder enables users to quickly load samples within 1 minute and then tilt (up to 90°), lift and rotate them without losing sight of the sample detail.  The real-time 3D visualisation module shows the actual position and orientation at all times while the anti-collision mechanism keeps the sample and SEM safe.

Tensile Sample Holder

This tensile sample holder enables mechanical testing by measuring the force required to compress or elongate a specimen to breaking point, to  predict how materials will behave in their intended applications. Suitable for observing fiber clusters, polymer films, thin metal films and biological and plant material.

What is Phenom Desktop SEM?

The Phenom XL is a desktop scanning electron microscope (SEM) manufactured by Thermo Scientific that is designed for extreme ease of use and allows faster high resolution imaging of large samples up to 100 mm x 100 mm x 40 mm and fully integrated EDS for elemental analysis. It achieves SEM magnification from 160x to 200,000x with a resolution of less than 9 nm.

How does desktop SEM compare to a floor-standing model SEM?

The Phenom XL G3 desktop SEM is easy to use, superfast and simple to setup compared to traditional floor-standing SEMs, with a load-to-image time of under 40 seconds and an intuitive user interface. It accommodates samples up to 100 mm x 100 mm (compatible with standard 36 x 12 mm pin stubs) in a compact desktop footprint.

What magnification can Phenom XL achieve?

The Phenom XL achieves SEM magnification from 160x to 200,000x, with optical magnification of 3-16x.

What applications is Phenom XL suitable for?

The Phenom XL is suitable for applications in materials, metals, pharmaceuticals, chemicals, polymers, and forensics.

Can Phenom XL perform elemental analysis?

Yes. The Phenom XL includes EDS (Energy Dispersive Spectroscopy) capability, supporting elemental mapping and elemental analysis.

Can I have a demonstration or free trial of the Phenom XL SEM?

Yes. ATA Scientific offers free demonstrations and sample testing to help you evaluate the Phenom XL SEM with your specific application. Contact us for a booking or complete a request a demo form.

How much does a Phenom XL SEM cost?

The Phenom XL SEM comes in many affordable and scalable configurations depending on your sample and needs. By requesting a quote, our team will get back in touch with the best set of options for your organisation.

Phenom XL G3

Customer installations

University of Sydney

Phenom XL G3

The Engineering Analytical Facility (EAF) at the University of Sydney is a key hub providing researchers and students with access to state-of-the-art analytical instruments and technical expertise. To meet growing demand, the facility has expanded its capabilities with additional Phenom desktop SEMs in order to supercharge their user output! The EAF now operates two Phenom XL G2 systems, as well as a Phenom ProX system.

About the lab

University of Wollongong

Phenom XL G3

The University of Wollongong, School of Earth and Environmental Sciences has installed their new desktop Phenom XL SEM that will allow researchers to zoom in on geological, environmental and archaeological materials with up to 100,000 times magnification (<14 nm resolution). The Phenom XL has a large sample stage, allowing users to analyse samples up to 10 cm x 10 cm in area and determine elemental composition using the fully integrated Energy Dispersive Spectrometer (EDS).

About the lab

Macquarie University

Phenom XL G3

Macquarie University have installed their new superfast  bench-top Phenom XL Scanning Electron Microscope (SEM). The Phenom SEM will serve to assist researchers, students and industry with fast, high resolution imaging with elemental analysis of large samples up to 100mm x 100mm. The Backscatter detector yields sharp images together with chemical contrast information while the Secondary Electron Detector supports surface sensitive imaging.

About the lab

UWS

Phenom XL G3

UWS, Advanced Materials Characterisation Facility (AMCF) have installed their new bench-top Phenom XL Scanning Electron Microscope (SEM). The Phenom desktop SEM will serve to assist researchers, students and industry with fast, high resolution material analysis and characterisation.

About the lab

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