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Phenom Particle X series

Thermo Fisher Scientific

The Phenom ParticleX Desktop SEM Series combines automated Scanning Electron Microscopy (SEM) imaging with integrated energy-dispersive X-ray spectroscopy (EDS) for rapid particle characterisation and contamination analysis and fast report generation.
Manufacturer Thermo Scientific
Product Series Phenom Desktop SEM
Measurement principle Electron Microscopy SEM & Elemental Mapping
Application Gun Shot Residue, Additive Manufacturing, Technical cleanliness, Steel, Battery
Sample type Forensics, AM powder, Metallic/ non-metallic particles, Alloys, Battery material/cathodes
Optical magnification 3-16x
SEM magnification 160-200,000x
Sample size Up to 100mm (36 x 12mm pin stubs)
Load to image time <60sec

The Phenom ParticleX Desktop SEM Series is a family of automated desktop SEM systems designed for rapid particle analysis, contamination detection, and industrial quality control. By combining high-resolution SEM imaging, integrated EDS elemental analysis, and Perception automation software, it delivers fast, reproducible particle identification, classification, and reporting with minimal operator input.

Across the series, users benefit from a fully automated workflow for particle detection, sizing, and compositional analysis, delivering fast and consistent results. It outperforms optical microscopy and outsourced SEM services by enabling high-throughput batch analysis, standardised QA/QC reporting, and rapid in-house validation against industry standards — all within a compact, easy-to-use desktop platform.

The ParticleX range includes application-specific systems for different industries. ParticleX systems are purpose-built for Technical Cleanliness, Additive Manufacturing, Steel production, Gun Shot Residue analysis and Battery development.

ParticleX AM model supports additive manufacturing by providing fast, automated powder analysis that ensures consistent material quality. It reduces variability in powder reuse studies, enhances detection of irregular particles and contaminants, and delivers rapid feedback that supports tighter process control and improved end-product consistency. ParticleX AM ensures your powder analysis aligns with ASTM F1877-16, the recognised standard for SEM characterisation of particles.

ParticleX TC model enhances technical cleanliness testing by rapidly identifying and classifying contaminants that can affect component performance in automotive and precision manufacturing. It increases detection sensitivity compared with optical methods, reduces operator subjectivity, and produces standardised, audit-ready reports that support compliance with stringent industry cleanliness standards including ISO 16232 and VDA 19.

ParticleX Steel system focuses on inclusion analysis and metallurgical quality control. Precise detection and classification of non-metallic inclusions in steel and alloys together with high-resolution compositional analysis supports process optimisation, helps reduce defects, and ensures improved material reliability and performance in demanding applications. The ParticleX Steel automation package provides a comprehensive solution for meeting three key steel inclusion monitoring standards: ASTM E45, E2142, and E2283.

ParticleX Battery version accelerates impurity and contamination analysis in energy storage materials, supporting safer and more efficient battery development. It enables rapid identification of trace contaminants that can impact electrochemical performance and supports higher consistency in battery production.

ParticleX GSR system automates gunshot residue analysis, for forensic applications enabling rapid detection and classification of trace particles. It reduces analysis time from hours to minutes, improves reproducibility by minimising operator bias, and provides reliable elemental confirmation of trace evidence to support criminal investigations. Phenom GSR software is ASTM E1588 compliant.

Resources

All in one imaging and analysis

Compact desktop SEM with X-ray (EDS) analysis that needs little space and no extra facilities that allows sample structures can be physically examined and their elemental composition determined.

Super-fast

After loading the sample an instant optical image is received followed by an electron image in <60 seconds.

Ease of use with “never lost” sample navigation

Equipped with an optical colour microscope the user can swiftly navigate to any region of interest with just a single click and keep the image overview of the sample.

Low maintenance

The long lifetime, high brightness thermionic source (CeB6 ) enables extremely stable operation and has a typical operational lifetime of 3000 hours, which is ideal for maximum useability, serviceability and uptime.

Multiple detectors for additional information
Back-Scatter Detector (BSD) yields sharp images and provides chemical contrast information. An optional Secondary Electron Detector (SED) enables surface sensitive imaging. The fully integrated Energy Dispersive Spectroscopy (EDS) system provides elemental analysis. Acceleration voltages can be adjusted: 2 kV, 5 kV, 10 kV, 15 kV, and 20 kV.

Intuitive Phenom Perception software

Automated analysis and classification software uses a four step wizard that allows the user to achieve fast and reliable results.

• Material sciences – observe and analyse surfaces, compounds and particles
• Industrial manufacturing – paints & coatings, construction materials, filtration, automotive and aerospace engineering
• Life sciences – Biomedical, food, microbiology, cell biology
• Forensics – Crime scene investigation, gunshot residue, traffic accidents
• Electronics – component PCBs, MEMS, Semiconductor, data storage, battery, energy storage
• Earth Sciences –Environment, minerals, Paleontology

Standard sample holder

The standard sample holder is a compact stage allowing analysis of samples of up to 100 mm x 100 mm. The holder can be extended with 3 types of resin or metallurgical mount inserts.

Sample size

  • 100 mm x 100 mm (up to 36 x 12 mm pin stubs)
  • Max. 65 mm (h)

Eucentric sample holder

This unique  6 axis Eucentric sample holder enables users to quickly load samples within 1 minute and then tilt (up to 90°), lift and rotate them without losing sight of the sample detail.  The real-time 3D visualisation module shows the actual position and orientation at all times while the anti-collision mechanism keeps the sample and SEM safe.

Tensile Sample Holder

This tensile sample holder enables mechanical testing by measuring the force required to compress or elongate a specimen to breaking point, to  predict how materials will behave in their intended applications. Suitable for observing fiber clusters, polymer films, thin metal films and biological and plant material.

What is Phenom ParticleX Desktop SEM?

The Phenom ParticleX SEM is built on the Phenom XL, a desktop scanning electron microscope (SEM) manufactured by Thermo Scientific that is designed for extreme ease of use and allows faster high-resolution imaging of large samples up to 100 mm x 100 mm x 40 mm and fully integrated EDS for elemental analysis. It includes a range of automated options for in-house analysis to identify faults in materials and validation of produced goods against industry-approved standards. 

How does desktop SEM compare to a floor-standing model SEM?

The Phenom XL G3 desktop SEM is easy to use, superfast and simple to setup compared to traditional floor-standing SEMs, with a load-to-image time of under 40 seconds and an intuitive user interface. It accommodates samples up to 100 mm x 100 mm (compatible with standard 36 x 12 mm pin stubs) in a compact desktop footprint.

What magnification can Phenom XL achieve?

The Phenom XL achieves SEM magnification from 160x to 200,000x, with optical magnification of 3-16x.

What applications is Phenom XL suitable for?

The Phenom XL is suitable for applications in materials, metals, pharmaceuticals, chemicals, polymers, and forensics.

Can Phenom XL perform elemental analysis?

Yes. The Phenom XL includes EDS (Energy Dispersive Spectroscopy) capability, supporting elemental mapping and elemental analysis.

Can I have a demonstration or free trial of the Phenom XL SEM?

Yes. ATA Scientific offers free demonstrations and sample testing to help you evaluate the Phenom XL SEM with your specific application. Contact us for a booking or complete a request a demo form.

Phenom Particle X series

Customer installations

Earth AI

Phenom Particle X series

Earth AI has installed their new Thermo Scientific Phenom XL Desktop SEM. The company Earth AI uses artificial intelligence and proprietary drilling technology to discover critical mineral deposits (such as copper, nickel, and gold) faster and cheaper than traditional mining methods. See video here

About the lab

Hysata

Phenom Particle X series

Hysata has installed their new Thermo Scientific Phenom XL Desktop SEM. The company manufactures ultra-efficient electrolysers used to produce green hydrogen from renewable electricity and water. Based in Port Kembla, Australia, the company has developed a breakthrough “capillary-fed” technology that is approximately 20% more efficient than existing commercial systems.

About the lab

UWS

Phenom Particle X series

The UWS through collaboration with Phenom-World BV, and ATA Scientific has been able to secure a 2 year placement of the bench-top Scanning Electron Microscope (Phenom SEM) for the shared Centralised Research Facilities to support both research and teaching. The SEM will spend time at Parramatta, Hawkesbury, Campbelltown and Kingswood campuses.

About the lab

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