Phenom Pure G7 desktop Scanning Electron Microscope (SEM) is based on the widely recognised Phenom desktop SEM platform and is a high-performance SEM for imaging and analysis.
It is an affordable desktop Scanning Electron Microscope (SEM) designed for extreme ease of use and fast sample imaging. The proprietary venting/loading mechanism enables the highest throughput and ensures a time-to- image of less than 30 seconds. The unique optical navigation camera displays a view of the entire sample and allows the user to move to any spot on the sample with just a single click.
The high brightness cerium hexaboride (CeB6) electron source reduces maintenance costs, lasting 30 times longer than traditional tungsten filaments. In combination with the four-segment Backscatter detector (BSD) it yields sharp images together with chemical contrast information.
When user requirements change over time, the Phenom Pure G7 SEM can be upgraded to the Phenom Pro or ProX Desktop SEM models for enhanced capabilities.
Originating from parent companies FEI and Philips, all Phenom desktop SEM systems are built to high-quality standards and offer a new approach for high-resolution imaging which is extremely fast and easy to use. The user interface supports both existing and new users to quickly become familiar with the system and get the most out of it without the need for significant set-up or training.
The Phenom SEM covers a wide range of applications which include Forensic investigation, Material characterisation, Metallurgy analysis, Process control, Pharmaceutical and Industrial research and more.