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Phenom P-Series G7

Thermo Fisher Scientific

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Phenom Pure G7 is an economical desktop Scanning Electron Microscope (SEM) that provides high resolution imaging that is superfast and easy to use.
Manufacturer Thermo Scientific
Product Series Phenom Desktop SEM
Measurement principle Electron Microscopy SEM & Elemental Mapping
Application Scanning Electron Microscopy
Sample type Materials, metals, pharmaceuticals, chemical, polymers, forensics
SEM magnification 160 – 175,000x
Resolution <15nm
Optical magnification 27x
Sample size Up to 32mm
Load to image time <30sec

Phenom Pure G7 desktop Scanning Electron Microscope (SEM)  is based on the widely recognised Phenom desktop SEM platform and is a high-performance SEM for imaging and analysis.

It is an affordable desktop Scanning Electron Microscope (SEM) designed for extreme ease of use and fast sample imaging. The proprietary venting/loading mechanism enables the highest throughput and ensures a time-to- image of less than 30 seconds. The unique optical navigation camera displays a view of the entire sample and allows the user to move to any spot on the sample with just a single click.

The high brightness cerium hexaboride (CeB6) electron source reduces maintenance costs, lasting 30 times longer than traditional tungsten filaments. In combination with the four-segment Backscatter detector (BSD) it yields sharp images together with chemical contrast information.

When user requirements change over time, the Phenom Pure G7 SEM can be upgraded to the Phenom Pro or ProX Desktop SEM models for enhanced capabilities.

Originating from parent companies FEI and Philips, all Phenom desktop SEM systems are built to high-quality standards and offer a new approach for high-resolution imaging which is extremely fast and easy to use. The user interface supports both existing and new users to quickly become familiar with the system and get the most out of it without the need for significant set-up or training.

The Phenom SEM covers a wide range of applications which include Forensic investigation, Material characterisation, Metallurgy analysis, Process control, Pharmaceutical and Industrial research and more.

Resources

Super fast, affordable SEM

After loading the sample an instant optical image is received followed by an electron image in <30 seconds.

Ease of use with “never lost” sample navigation

Equipped with an optical colour microscope the user can swiftly navigate to any region of interest with just a single click and keep the image overview of the sample.

Low maintenance

The long lifetime, high brightness thermionic source (CeB6 ) enables extremely stable operation and has a typical operational lifetime of 3000 hours, which is ideal for maximum useability, serviceability and uptime.

Multiple detectors for additional information

Back-Scatter Detector (BSD) yields sharp images and provides chemical contrast information. An optional Secondary Electron Detector (SED) enables surface sensitive imaging.

Acceleration voltages can be adjusted: 5 kV to 15 kV.

Intuitive software

  • ChemiSEM Technology – provides real-time, color-coded elemental mapping.
  • PPI/PPA – Programming Interface (API) that enables users to control Phenom desktop SEM through Python scripting.
  • ProSuite –  includes applications such as ParticleMetric, PoroMetric, FiberMetric and 3D Roughness Reconstruction.
  • Maps 3 Software – automates acquisition of large datasets, including SEM imaging and EDS mapping, and seamlessly stiches and aligns them to provide detailed images across large sample areas.
  • Material sciences – observe and analyse surfaces, compounds and particles Industrial manufacturing – paints & coatings, construction materials, filtration, automotive and aerospace engineering
  • Industrial manufacturing – paints & coatings, construction materials, filtration,automotive and aerospace engineering
  • Life sciences – Biomedical, food, microbiology, cell biology
  • Forensics – Crime scene investigation, gunshot residue, traffic accidents
  • Electronics – component PCBs, MEMS, Semiconductor and data storage
  • Earth Sciences –Environment, minerals, Paleontology
  • Education – inspire young students to see the world 10 times smaller than the wavelength of visible light

Scanning Transmission Electron Microscopy Sample Holder (STEM)

Designed for the Phenom Pharos FEG SEM, this STEM detector achieves high contrast imaging under low voltage, which is particularly useful to view biological structures and morphology. See datasheet here

Standard sample holder

Suitable for most samples up to 25mm diameter and 30mm height, mounted on standard sample pin stubs.

Charge reduction sample holder

Designed to reduce charging and eliminate extra sample preparation (coating) for non-conductive samples such as paper, organic material, glass… etc

Metallurgical sample holder

Designed to support resin-mounted samples for metallurgy or when working with inserts. Charge reduction version also available for non-conductive samples.

Micro tool and tilt-rotation sample holder

Suitable for imaging long objects such as drill bits, milling tools and needles.

Motorized tilt and rotation sample holder

Enables a unique 3D image of your sample by allowing the analysis from all visible sides.

Temperature controlled sample holder

Allows the study of vacuum sensitive and fragile samples such as biological, food or organic coatings. Temperature can be controlled from -25°C to +50°C.

X-view Insert

Provides fast, easy clamping without the need for screws and is ideal for cross sectional imaging of coatings and multilayer samples.

Micro-electronics insert

Provides a unique clamping mechanism for imaging semi conductor, microelectronics or solar cells.

Nebula

Provides uniform dry powder dispersion on SEM pin stubs while protecting fragile particle structures.

What is Phenom Pure Desktop SEM?

The Phenom Pure is the entry level desktop scanning electron microscope (SEM) manufactured by Thermo Scientific that is designed for extreme ease of use and allows faster high-resolution imaging for a wide variety of samples. It offers exceptional image quality thanks to the high-brightness, long-lasting CeB6 source. Upgradability allows you to level up on site to the Phenom Pro or ProX Desktop SEM models for enhanced capabilities.

How does a desktop SEM compare to a floor-standing model SEM?

The Phenom Pure desktop SEM is easy to use, superfast and simple to setup compared to traditional floor-standing SEMs, with a load-to-image time of under 40 seconds and an intuitive user interface in a compact desktop footprint.

What applications is Phenom Pure suitable for?

The Phenom Pure is suitable for applications in materials, metals, pharmaceuticals, chemicals, polymers, forensics and more.

Can Phenom Pure perform elemental analysis?

Yes. The Phenom Pure can be equipped with an integrated EDS (Energy Dispersive Spectroscopy) capability, supporting elemental mapping and elemental analysis.

Can I have a demonstration or free trial of the Phenom SEM?

Yes. ATA Scientific offers free demonstrations and sample testing to help you evaluate the Phenom SEM with your specific application. Contact us for a booking or complete a request a demo form.

How much does a Phenom SEM cost?

The Phenom SEM comes in many affordable and scalable configurations depending on your sample and needs. By requesting a quote, our team will get back in touch with the best set of options for your organisation.

Phenom Pro G7 is a desktop Scanning Electron Microscope (SEM) that is superfast and easy to use and provides high resolution imaging and analysis.
Manufacturer Thermo Scientific
Product Series Phenom Desktop SEM
Measurement principle Electron Microscopy SEM & Elemental Mapping
Application Scanning Electron Microscopy
Sample type Materials, metals, pharmaceuticals, chemical, polymers, forensics
SEM magnification 160-350,000x
Resolution <6nm (SED)
Optical magnification 27-160x
Sample size Up to 32mm
Load to image time <30sec

Phenom Pro G7 desktop Scanning Electron Microscope (SEM) is a high-performance SEM for imaging and analysis.

Phenom Pro G7 SEM is designed for extreme ease of use and enables the fastest imaging of samples. The proprietary venting/loading mechanism supports the highest throughput and ensures a time-to- image of less than 30 seconds. The unique optical navigation camera displays a view of the entire sample and allows the user to move to any spot on the sample with just a single click.

The high brightness cerium hexaboride (CeB6) electron source reduces maintenance costs, lasting 30 times longer than traditional tungsten filaments. In combination with the four-segment Backscatter detector (BSD) yields sharp images together with chemical contrast information. A secondary electron detector (SED) is optionally available. The SED collects low energy electrons from the top surface layer of the sample making it ideal for studying surfaces of micro structures, nano structures or particles.

A key feature of the Phenom Pro G7 is its easy-to-use, intuitive user interface (UI). Based on the proven ease-of-use technology already applied in the series, the workflow for the analysis software is now integrated meaning users can view images and perform analysis simultaneously on a single screen. Operating the SEM has been made easier via the interactive databar and overlay structure. The interface enables both existing and new users to quickly become familiar with the system with less training.

The Phenom Pro G7 can be upgraded to Phenom ProX G7 with fully integrated X-Ray analysis (Energy Dispersive Spectrometer, EDS) that allows the user to quickly identify and assess the distribution of elements in a sample. Additional sample holders allow for both conductive and non-conductive samples to analysed without the need for coating. Options are also available for sample tilting and cooling.

Further analysis is provided using optional ChemiSEM Technology, PPI/PPA,  Maps 3, and ProSuite software which includes ParticleMetric, PoroMetric, FiberMetric and 3D Roughness Reconstruction.

The Phenom SEM covers a wide range of applications such as Forensic investigation, Material characterisation, Metallurgy analysis, Process control, Pharmaceutical and Industrial research and more.

The Phenom Pro G7 is a user friendly and affordable tool that bridges the gap between the optical microscope and ultra-high resolution microscopes.

Resources

All in one imaging and analysis

Compact desktop SEM with X-ray (EDS) analysis that needs little space and no extra facilities. Sample structures can be physically examined and their elemental composition determined. Offload work from your floor-model SEMs and expand research capabilities.

Super-fast

After loading the sample an instant optical image is received followed by an electron image in < 30 seconds.

Ease of use with “never lost” sample navigation

Equipped with an optical colour microscope the user can swiftly navigate to any region of interest with just a single click and keep the image overview of the sample.

Low maintenance

The long lifetime, high brightness thermionic source (CeB6 ) enables extremely stable operation and has a typical operational lifetime of 3000 hours, which is ideal for maximum useability, serviceability and uptime.

Multiple detectors for additional information
Back-Scatter Detector (BSD) yields sharp images and provides chemical contrast information. An optional Secondary Electron Detector (SED) enables surface sensitive imaging.

Acceleration voltages can be adjusted: 2 kV, 5 kV, 10 kV, 15 kV, 20 kV.

Intuitive software

  • ChemiSEM Technology – provides real-time, color-coded elemental mapping.
  • PPI/PPA – Programming Interface (API) that enables users to control Phenom desktop SEM through Python scripting.
  • ProSuite –  includes applications such as ParticleMetric, PoroMetric, FiberMetric and 3D Roughness Reconstruction.
  • Maps 3 Software – automates acquisition of large datasets, including SEM imaging and EDS mapping, and seamlessly stiches and aligns them to provide detailed images across large sample areas.
  • Material sciences – observe and analyse surfaces, compounds and particles Industrial manufacturing – paints & coatings, construction materials, filtration, automotive and aerospace engineering
  • Life sciences – Biomedical, food, microbiology, cell biology
  • Forensics – Crime scene investigation, gunshot residue, traffic accidents
  • Electronics – component PCBs, MEMS, Semiconductor and data storage
  • Earth Sciences –Environment, minerals, Paleontology
  • Education – inspire young students to see the world 10 times smaller than the wavelength of visible light

Scanning Transmission Electron Microscopy Sample Holder (STEM)

Designed for the Phenom Pharos FEG SEM, this STEM detector achieves high contrast imaging under low voltage, which is particularly useful to view biological structures and morphology. See datasheet here

Standard sample holder

Suitable for most samples up to 25mm diameter and 30mm height, mounted on standard sample pin stubs.

Charge reduction sample holder

Designed to reduce charging and eliminate extra sample preparation (coating) for non-conductive samples such as paper, organic material, glass… etc

Metallurgical sample holder

Designed to support resin-mounted samples for metallurgy or when working with inserts. Charge reduction version also available for non-conductive samples.

Micro tool and tilt-rotation sample holder

Suitable for imaging long objects such as drill bits, milling tools and needles.

Motorized tilt and rotation sample holder

Enables a unique 3D image of your sample by allowing the analysis from all visible sides.

Temperature controlled sample holder

Allows the study of vacuum sensitive and fragile samples such as biological, food or organic coatings. Temperature can be controlled from -25°C to +50°C.

X-view Insert

Provides fast, easy clamping without the need for screws and is ideal for cross sectional imaging of coatings and multilayer samples.

Micro-electronics insert

Provides a unique clamping mechanism for imaging semi conductor, microelectronics or solar cells.

Nebula

Provides uniform dry powder dispersion on SEM pin stubs while protecting fragile particle structures.

What is Phenom Pro Desktop SEM?

The Phenom Pro delivers high-quality results from a compact desktop scanning electron microscope (SEM) manufactured by Thermo Scientific that is designed for extreme ease of use and allows faster high-resolution imaging for a wide variety of samples. It offers exceptional image quality thanks to the high-brightness, long-lasting CeB6 source. Upgradability allows you to level up on site to the Phenom ProX Desktop SEM model for enhanced capabilities.

How does a desktop SEM compare to a floor-standing model SEM?

The Phenom Pro desktop SEM is easy to use, superfast and simple to setup compared to traditional floor-standing SEMs, with a load-to-image time of under 40 seconds and an intuitive user interface in a compact desktop footprint.

What applications is Phenom Pro suitable for?

The Phenom Pro is suitable for applications in materials, metals, pharmaceuticals, chemicals, polymers, forensics, battery development and more.

Can Phenom Pro perform elemental analysis?

Yes. The Phenom Pro can be equipped with an integrated EDS (Energy Dispersive Spectroscopy) capability, supporting elemental mapping and elemental analysis.

Can I have a demonstration or free trial of the Phenom SEM?

Yes. ATA Scientific offers free demonstrations and sample testing to help you evaluate the Phenom SEM with your specific application. Contact us for a booking or complete a request a demo form.

How much does a Phenom SEM cost?

The Phenom SEM comes in many affordable and scalable configurations depending on your sample and needs. By requesting a quote, our team will get back in touch with the best set of options for your organisation.

Phenom ProX G7 is an all-in- one desktop Scanning Electron Microscope (SEM) that is superfast and easy to use and provides high resolution imaging with elemental analysis.
Manufacturer Thermo Scientific
Product Series Phenom Desktop SEM
Measurement principle Electron Microscopy SEM & Elemental Mapping
Application Elemental Mapping (EDS), Scanning Electron Microscopy
Sample type Materials, metals, pharmaceuticals, chemical, polymers, forensics
SEM magnification 160-350,000x
Resolution <6nm (SED)
Optical magnification 27-160x
Sample size Up to 32mm
Load to image time <30 sec

Phenom ProX G7 desktop Scanning Electron Microscope (SEM) with a fully integrated energy dispersive X-ray spectroscopy (EDS) detector provides detailed X-ray elemental analysis in addition to high-performance imaging.

Phenom ProX G7 SEM is designed for extreme ease of use and enables the fastest imaging of samples. The proprietary venting/loading mechanism supports the highest throughput and ensures a time-to- image of less than 30 seconds. The unique optical navigation camera displays a view of the entire sample and allows the user to move to any spot on the sample with just a single click.

The high brightness cerium hexaboride (CeB6) electron source reduces maintenance costs, lasting 30 times longer than traditional tungsten filaments. In combination with the four-segment Backscatter detector (BSD) Phenom ProX yields sharper images together with chemical contrast information. A secondary electron detector (SED) is optionally available on the Phenom ProX. The SED collects low energy electrons from the top surface layer of the sample making it ideal for studying surfaces of micro structures, nano structures or particles.

A key feature of the Phenom ProX G7 is its easy-to-use, intuitive user interface (UI). Based on the proven ease-of-use technology already applied in the series, the workflow for the analysis software is integrated meaning users can view images and perform analysis simultaneously on a single screen. Operating the SEM has been made easier via the interactive databar and overlay structure. The interface enables both existing and new users to quickly become familiar with the system with less training.

Unlike other systems the Phenom has fully integrated X-Ray analysis (Energy Dispersive Spectrometer, EDS) that allows the user to quickly identify and assess the distribution of elements in a sample. Additional sample holders allow for both conductive and non-conductive samples to analysed without the need for coating. Options are also available for sample tilting and cooling.

Further analysis is provided using optional ChemiSEM Technology, PPI/PPA,  Maps 3, and ProSuite software which includes ParticleMetric, PoroMetric, FiberMetric and 3D Roughness Reconstruction.

The Phenom ProX covers a wide range of applications such as Forensic investigation, Material characterisation, Metallurgy analysis, Process control, Pharmaceutical and Industrial research and more.

The Phenom ProX is a user friendly and affordable tool that bridges the gap between the optical microscope and ultra-high resolution microscopes.

Resources

All in one imaging and analysis

Compact desktop SEM with X-ray (EDS) analysis that needs little space and no extra facilities. Sample structures can be physically examined and their elemental composition determined. Offload work from your floor-model SEMs and expand research capabilities.

Super-fast

After loading the sample an instant optical image is received followed by an electron image in < 30 seconds.

Ease of use with “never lost” sample navigation

Equipped with an optical colour microscope the user can swiftly navigate to any region of interest with just a single click and keep the image overview of the sample.

Low maintenance

The long lifetime, high brightness thermionic source (CeB6 ) enables extremely stable operation and has a typical operational lifetime of 3000 hours, which is ideal for maximum useability, serviceability and uptime.

Multiple detectors for additional information

Back-Scatter Detector (BSD) yields sharp images and provides chemical contrast information. An optional Secondary Electron Detector (SED) enables surface sensitive imaging.

Acceleration voltages can be adjusted: 2 kV, 5 kV, 10 kV, 15 kV, 20 kV.

Mobile SEM configuration

The Phenom ProX  desktop SEM allows for  SEM imaging on a mobile platform. It can be used in remote locations for fast and accurate investigations and analysis onsite. The system can be moved between project locations with maximum up time, creating efficiency for the user, and minimising waiting time for customers.

Intuitive software

The distribution of elements can be studied using Point analysis, Elemental Mapping and Line Scan.

  • ChemiSEM Technology – provides real-time, color-coded elemental mapping.
  • PPI/PPA – Programming Interface (API) that enables users to control Phenom desktop SEM through Python scripting.
  • ProSuite –  includes applications such as ParticleMetric, PoroMetric, FiberMetric and 3D Roughness Reconstruction.
  • Maps 3 Software – automates acquisition of large datasets, including SEM imaging and EDS mapping, and seamlessly stiches and aligns them to provide detailed images across large sample areas.
  • Material sciences – observe and analyse surfaces, compounds and particles
  • Industrial manufacturing – paints & coatings, construction materials, filtration, automotive and aerospace engineering
  • Life sciences – Biomedical, food, microbiology, cell biology
  • Forensics – Crime scene investigation, gunshot residue, traffic accidents
  • Electronics – component PCBs, MEMS, Semiconductor and data storage
  • Earth Sciences –Environment, minerals, Paleontology
  • Education – inspire young students to see the world 10 times smaller than the wavelength of visible light

Scanning Transmission Electron Microscopy Sample Holder (STEM)

Designed for the Phenom Pharos FEG SEM, this STEM detector achieves high contrast imaging under low voltage, which is particularly useful to view biological structures and morphology. See datasheet here

Standard sample holder

Suitable for most samples up to 25mm diameter and 30mm height, mounted on standard sample pin stubs.

Charge reduction sample holder

Designed to reduce charging and eliminate extra sample preparation (coating) for non-conductive samples such as paper, organic material, glass… etc

Metallurgical sample holder

Designed to support resin-mounted samples for metallurgy or when working with inserts. Charge reduction version also available for non-conductive samples.

Micro tool and tilt-rotation sample holder

Suitable for imaging long objects such as drill bits, milling tools and needles.

Motorized tilt and rotation sample holder

Enables a unique 3D image of your sample by allowing the analysis from all visible sides.

Temperature controlled sample holder

Allows the study of vacuum sensitive and fragile samples such as biological, food or organic coatings. Temperature can be controlled from -25°C to +50°C.

X-view Insert

Provides fast, easy clamping without the need for screws and is ideal for cross sectional imaging of coatings and multilayer samples.

Micro-electronics insert

Provides a unique clamping mechanism for imaging semi conductor, microelectronics or solar cells.

Nebula

Provides uniform dry powder dispersion on SEM pin stubs while protecting fragile particle structures.

What is Phenom ProX Desktop SEM?

The Phenom ProX delivers high-quality results from a compact desktop scanning electron microscope (SEM) manufactured by Thermo Scientific that is designed for extreme ease of use and allows faster high-resolution imaging for a wide variety of samples. It offers exceptional image quality thanks to the high-brightness, long-lasting CeB6 source.

How does a desktop SEM compare to a floor-standing model SEM?

The Phenom ProX desktop SEM is easy to use, superfast and simple to setup compared to traditional floor-standing SEMs, with a load-to-image time of under 40 seconds and an intuitive user interface in a compact desktop footprint.

What applications is Phenom ProX suitable for?

The Phenom ProX is suitable for applications in materials, metals, pharmaceuticals, chemicals, polymers, forensics, battery development and more.

Can Phenom ProX perform elemental analysis?

Yes. The Phenom ProX includes an integrated EDS (Energy Dispersive Spectroscopy) capability, supporting elemental mapping and elemental analysis.

Can I have a demonstration or free trial of the Phenom SEM?

Yes. ATA Scientific offers free demonstrations and sample testing to help you evaluate the Phenom SEM with your specific application. Contact us for a booking or complete a request a demo form.

How much does a Phenom SEM cost?

The Phenom SEM comes in many affordable and scalable configurations depending on your sample and needs. By requesting a quote, our team will get back in touch with the best set of options for your organisation.

Variant comparison

Phenom P-Series G7 Pure

  • Entry level SEM
  • CeB6 crystal Electron Source
  • 175,000x Magnification
  • 15 nm SEM Resolution – SED

Phenom P-Series G7 Pro

  • Advanced CeB6 SEM with EDS (Optional)
  • CeB6 crystal Electron Source
  • 350,000x Magnification
  • 6 nm SEM Resolution – SED

Phenom P-Series G7 ProX

  • Advanced CeB6 SEM with EDS (standard)
  • CeB6 crystal Electron Source
  • 350,000x Magnification
  • 6 nm SEM Resolution – SED

 

Phenom Pure Phenom Pro/ProX Phenom Particle X/XL Phenom Pharos 
Entry level SEM Advanced SEM with EDS Large sample SEM FEG SEM/STEM
High-brightness CeB6 source High-brightness CeB6 source High-brightness CeB6 source Field Emission Gun (FEG) source
175,000x magnification 350,000x magnification 200,000x magnification 2,000,000x magnification
15 nm resolution 6 nm resolution 9 nm resolution <2 nm resolution
2, 5 or 10 kV Acceleration voltage range 1.5 – 20 kV Acceleration voltage range 1.5 – 20 kV Acceleration voltage range 1 – 20 kV Acceleration voltage range
Single pin stub, 25 mm diameter* Single pin stub, 25 mm diameter* Up to 36 pin stubs100 mm x 100 mm* Single pin stub, 25 mm diameter*
BSD standard; SED/EDS optional** Pro: BSD standard, SED/EDS optional** ProX: BSD/EDS standard, SED optional** BSD standard, SED/EDS optional** BSD/EDS standard, SED/STEM optional**
Low vacuum mode 1 Pa – 60 Pa Low vacuum mode, 1 Pa – 60 Pa Low vacuum mode, 0.1 Pa – 1 Pa – 60 Pa Low vacuum mode, 0.1 Pa – 1 Pa – 60 Pa
*optional 35 mm and 100 mm (h) available

**BSD – Four-quadrant backscattered electron detector (standard)
SED – Everhart-Thornley secondary electron detector (optional)
EDS/EDX – Integrated energy dispersive x-ray spectrometer (optional)
STEM – Fully integrated Scanning Transmission Electron Microscopy (STEM-in-SEM)

Phenom P-Series G7

Customer installations

Department of Agriculture, Fisheries and Forestry

Phenom P-Series G7

The Department of Agriculture, Fisheries and Forestry in Queensland has installed their new Thermo Scientific Phenom Pure G6 Desktop Scanning Electron Microscope. The group is working to enhance Australia’s agricultural industries and trade, and manage the threat of biosecurity risks to Australia for many high-risk animal and plant pests and diseases.

About the lab

University of Melbourne

Phenom P-Series G7

The University of Melbourne, School of Chemistry has installed their new Thermo Scientific Phenom ProX Desktop Scanning Electron Microscope. The group is working on uncovering new avenues for efficient light-to-chemical energy conversion, and for ultra-sensitive molecular (bio)sensing.

About the lab

Monash University

Phenom P-Series G7

Monash University, Materials Science and Engineering recently installed their new desktop Phenom Pro SEM. The group is placed at the cutting edge where understanding material behaviour is the key to advances in many fields such as Biomedical engineering, Nanotechnology including additive manufacturing and 3D printing. The SEM will provide key insight into 3D printed alloys used for implants to optimise the bone interface with the metal surface.

About the lab

Flinders University

Phenom P-Series G7

The Archaeological Research Laboratory at Flinders University have recently installed their new Phenom XL, an all-in- one desktop Scanning Electron Microscope (SEM). The Phenom XL SEM will assist with broadening understanding of indigenous, historical and maritime archaeology by facilitating the research, teaching, laboratory and field work of staff and research students.

About the lab

Komatsu

Phenom P-Series G7

Komatsu, global supplier of construction and mining equipment, recently installed their new Phenom XL, an all-in- one desktop Scanning Electron Microscope (SEM). The Phenom XL is superfast, easy to use and provides high resolution imaging with elemental analysis of large samples up to 100mm x 100mm.

About the lab

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