New Phenom XL G2 Desktop SEM with Advanced Automation
The new Phenom XL G2 Desktop SEM takes automation to the next level, by providing fast, accurate information needed to reduce failures, avoid delays and optimise production processes.
The Phenom XL G2 Desktop SEM offers a versatile solution for automating quality control.
With the Phenom XL G2, users can obtain high-quality images in just 40 seconds—three times faster than other desktop SEM systems on the market. The system offers an improved resolution of 10 nanometers, enabling even more resolving power and the ability to explore large samples of up to 100 by 100 millimeters.
A key feature of the Phenom XL G2 is its new, easy-to-use user interface (UI). By combining what were once separate screens for images and analyses into a single full-screen image, the new UI provides faster access to information needed to assess product quality. If the user finds a possible impurity in the image, a simple click on the spot will provide a list of elements present using live energy-dispersive X-ray (EDS) analysis. The optical navigation camera makes it possible to view the entire sample while the user is in SEM mode.
With the Phenom XL G2, quality control managers can automate repetitive workflows for faster, more accurate analyses of particles, pores, fibers, and large SEM images enabling more time for value-added work.
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